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Continue to ChatHolistic Device Modeling: Toward a Unified MOSFET Model Including Variability, Aging, and Extreme Operating Conditions - https://avesis.itu.edu.tr/yayin/af94dfcf-be86-4170-bd4c-7e48c4b2cbb6/holistic-device-modeling-toward-a-unified-mosfet-model-including-variability-aging-and-extreme-operating-conditions